NDLI: A new algorithm for adaptive threshold generation in robust fault detection based on a sliding window and global optimization

Content Provider	IEEE Xplore Digital Library
Author	Puig, V. Saludes, J. Quevedo, J.
Copyright Year	1999
Description	Author affiliation: Dept. MMI, Univ. Politec. de Catalunya, Terrassa, Spain (Saludes, J.) \|\| Dept. Esaii, Univ. Politec. de Catalunya, Terrassa, Spain (Puig, V.; Quevedo, J.)
Abstract	Robust fault detection based on envelopes generated using a parameter bounded model has been studied from several approaches. But none of the existing approaches can produce the exact system envelopes without increasing the uncertainty over the system states, or at least, approximate envelopes controlling the degree of uncertainty added by the envelope generation algorithm. This paper presents a new approach based on global optimization and the sliding window paradigm. The optimal length of the sliding window can be determined analytically and it has been proved that its length is the order of settling time of the system. The paper focuses on solving the problems of global optimization resulting after applying the new envelope generation algorithm. Several approaches to solve this global optimization problem are proposed. At the end of the paper these techniques are compared using an example. The main objective of the paper is to determine a global optimization technique suitable to solve the optimization problems that appear after applying the envelope generation algorithm, using the less possible time because this algorithm should operate in real time.
Starting Page	1546
Ending Page	1551
File Size	3015720
Page Count	6
File Format	PDF
ISBN	9783952417355
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-08-31
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	EUCA
Subject Keyword	Adaptation models Uncertainty Adaptive systems Constraint Satisfaction Problem Robust Fault Detection Adaptive Threshold Global Optimization Optimization Envelope Generation Sliding Window Principle Fault detection Robustness Mathematical model
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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