NDLI: An efficient run-time encryption scheme for non-volatile main memory

Content Provider	IEEE Xplore Digital Library
Author	Xian Zhang Chao Zhang Guangyu Sun Jia Di Tao Zhang
Copyright Year	2013
Description	Author affiliation: Univ. of Arkansas, Fayetteville, AR, USA (Jia Di) \|\| Pennsylvania State Univ., State College, PA, USA (Tao Zhang) \|\| Peking Univ., Beijing, China (Xian Zhang; Chao Zhang; Guangyu Sun)
Abstract	Emerging non-volatile memories (NVMs) have been considered as promising alternatives of DRAM for future main memory design. The NVM main memory has advantages of low standby power, high density, and good scalability. Its non-volatility, however, induces a security design challenge that data retained in memory after power-off need to be protected from malicious attacks. Although several approaches have been proposed to solve this problem through data encryption, they have some limitations such as high design complexity and non-trivial timing/energy overhead. Moreover, these techniques decrease the lifetime of NVM main memory due to extra write operations caused by encryption. In order to overcome these limitations, we propose an efficient PAD-XOR based encryption scheme in this work. A novel PAD generator based on a randomizer and several sub-PAD tables is introduced. With the PAD generator, our encryption scheme can provide run-time data protection to all data in NVM memory with low timing and power overhead. In addition, the encryption process can co-operate with wear-leveling of NVM to reduce design complexity. More important, our encryption technique has no impact on lifetime because no extra writes are incurred. Experimental results demonstrate that, compared to prior approaches, our design can achieve the same security strength with substantial lower overhead in respect of timing, energy consumption, and design complexity.
Starting Page	1
Ending Page	10
File Size	535205
Page Count	10
File Format	PDF
ISBN	9781479914005
DOI	10.1109/CASES.2013.6662530
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-29
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Nonvolatile memory Random access memory Generators Encryption Complexity theory
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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