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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lijun Jiang Chuan Xu Smith, H. Rubin, B. Deutsch, A. Caron, A. |
| Copyright Year | 2010 |
| Description | Author affiliation: IBM EDA, T. J. Watson Research Center, Yorktown Heights, NY 12570, USA (Lijun Jiang; Smith, H.; Rubin, B.; Deutsch, A.; Caron, A.) || Electrical and Computer Engineering, University of California at Santa Barbara, 93106, USA (Chuan Xu) |
| Abstract | In this talk, we will introduce a novel methodology using existing electromagnetic modelling tools for interconnect and packaging structures to simulate and model the temperature distribution without major modifications to these tools or simulated structures. This methodology can easily be integrated with the chip technology information and frame an electrical circuit simulator into an automatic, template-based simulation and optimization flow. A new accurate closed-form thermal model is further developed to simplify unnecessary object details. The model allows an equivalent medium with effective thermal conductivity (isotropic or anisotropic) to replace details in non-critical regions accurately so that complex interconnect structures can be simulated at a system level. Using these techniques, we demonstrate the modelling capability of very complex on-chip interconnects, packaging, and 3D integration technologies. |
| Starting Page | 625 |
| Ending Page | 628 |
| File Size | 722663 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424456215 |
| e-ISBN | 9781424456239 |
| DOI | 10.1109/APEMC.2010.5475701 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-04-12 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Temperature distribution Laplace equations Thermal resistance Circuit simulation Integrated circuit interconnections Electromagnetic modeling Very large scale integration Electronic packaging thermal management Thermal conductivity Electric resistance |
| Content Type | Text |
| Resource Type | Article |
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