NDLI: BRDF Estimation of Structural Color Object by Using Hyper Spectral Image

Content Provider	IEEE Xplore Digital Library
Author	Kobayashi, Y. Morimoto, T. Sato, I. Mukaigawa, Y. Ikeuchi, K.
Copyright Year	2013
Description	Author affiliation: Univ. of Tokyo, Tokyo, Japan (Kobayashi, Y.; Ikeuchi, K.) \|\| Toppan Printing Co., Ltd., Tokyo, Japan (Morimoto, T.) \|\| Nat. Inst. of Inf., Tokyo, Japan (Sato, I.) \|\| Osaka Univ., Suita, Japan (Mukaigawa, Y.)
Abstract	In computer graphics, there are several methods to render thin film interference effects, but it sets the parameters of interference manually. To reconstruct more accurate appearance of the thin film, we need to estimate the BRDF parameters of the thin film, the refractive index and film thickness. In this paper, we propose a novel method for estimating the BRDF of the thin film interference and representing the appearance accurately. Using peak wavelengths which enhance the spectral intensities, we estimate the refractive index and film thickness separately, and then it reduces the computational time of estimation comparied with the steepest descent method. In the experiments, we evaluate the accuracy of estimated parameters and reconstructed BRDF to show the effectiveness of our method.
Starting Page	915
Ending Page	922
File Size	944289
Page Count	8
File Format	PDF
ISBN	9781479930227
DOI	10.1109/ICCVW.2013.125
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-12-02
Publisher Place	Australia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Image color analysis Refractive index Estimation Interference Optical variables control Cameras Optical refraction Thin Film BRDF Spectrum
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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