NDLI: Investigation of robustness and performance comparisons of 3T - 4T DG-FinFETs for ultra low power subthreshold logic

Content Provider	IEEE Xplore Digital Library
Author	Vaddi, R. Dasgupta, S. Agarwal, R.P.
Copyright Year	2009
Description	Author affiliation: Semiconductor Devices and VLSI Technology Group, Department of Electronics and Computer Engineering, Indian Institute of TechnologyRoorkee.247667, India (Vaddi, R.; Dasgupta, S.; Agarwal, R.P.)
Abstract	Subthreshold logic has gained wide interest for ultra low power applications such as RFID, microsensors, energy harvesting etc. Double gate FinFETs are shown to be better candidates for subthreshold logic design than equivalent bulk devices, though it is not yet clear at this stage which configuration of DG-FinFETs will be more optimal for subthreshold logic. In this paper, we compare the different device and circuit level performance metrics of DG-FinFETs with different options for subthreshold logic. We observe that Energy Delay Product (EDP) shows to be a better subthreshold performance metric than PDP and the tied gate symmetric option has around 78% better EDP value than independent gate option. The asymmetry in oxide thickness further adds to reduction in EDP for tied gate and has no effect on independent gate option. The robustness of DG-FinFETs with different options has also been investigated in presence of parameter variations such as silicon body thickness, channel length, threshold voltage, supply voltage and temperature. Independent gate option has been seen to be more robust (≈40%) than tied gate option for subthreshold logic.
Starting Page	1
Ending Page	4
File Size	640416
Page Count	4
File Format	PDF
ISBN	9781424450732
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-12-14
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	CODEC
Subject Keyword	Measurement 4T 3T Subthreshold logic Logic design Delay Logic circuits FinFETs Ultra low power Robustness Threshold voltage Microsensors Logic devices DG-FinFETs Radiofrequency identification
Content Type	Text
Resource Type	Article

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