NDLI: Applicability and benefits of mutation analysis as an aid for unit testing

Content Provider	IEEE Xplore Digital Library
Author	Ramler, R. Kaspar, T.
Copyright Year	2012
Description	Author affiliation: Sch. of Inf., Commun. & Media, Univ. of Appl. Sci. Upper Austria, Hagenberg, Austria (Kaspar, T.) \|\| Software Competence Center Hagenberg, Hagenberg, Austria (Ramler, R.)
Abstract	Unit testing is a highly popular and widely practiced measure for assuring software quality. Nevertheless, writing good unit tests requires experience in test design and in applying the testing frameworks. Hence, existing unit test suites often suffer from issues that limit their defect detection capability or that impact the understandability and maintainability of the implemented tests. Several methods and techniques have been proposed to aid the developer in creating good unit tests. Mutation analysis is one of the most promising techniques to assess the quality of a test suite. Over the last years it has caught increasing attention by researchers and practitioners and a variety of tools have been developed to support this technique. In this work, mutation analysis is studied for its practical applicability and the potential benefits in providing guidance for unit testing. Five mutation analysis tools are investigated on four test suites representing different levels of test quality. The results show that the applied tools have reached an acceptable level of maturity although practical application still uncovers technical limitations. Furthermore, the study results indicate that the implemented mutation operators allow a good approximation of the actual quality of a test suite and an advantage over conventional code coverage measures when a comprehensive set of mutation operators has been implemented.
Sponsorship	IEEE Korea Council
Starting Page	920
Ending Page	925
File Size	646223
Page Count	6
File Format	PDF
ISBN	9781467308946
e-ISBN	9788994364223
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-12-03
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	AICIT
Subject Keyword	Unit Testing Mutation Testing Mutation Analysis
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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