NDLI: Single sampling inspection method of smart meter according to reliable life

Content Provider	IEEE Xplore Digital Library
Author	Hui Zhou Qinfeng Chen Hanji Ju Xiaolei Zhu
Copyright Year	2012
Description	Author affiliation: North China Grid Company, Limited Center of Metrology, Beijing, China (Hui Zhou; Hanji Ju; Xiaolei Zhu) \|\| School of Reliability and Systems Engineering, Beijing University of Aeronautics and Astronautics, China (Qinfeng Chen)
Abstract	This paper presents fast sampling inspection method based on the accelerated degradation test of the smart meters. This method uses the pseudo-life data obtained by the accelerated degradation test, then conducts distribution analysis, including distribution fitting and goodness-of-fit test to determine the final distribution of the pseudo-life data, and then choose sampling inspection method of reliability based on the distribution of information, and conduct the sampling inspection. Finally, this paper evaluates the reliability of the smart meters to see if it meets the requirements. The results can provide the basis for reliability assessment of the smart meter.
Starting Page	829
Ending Page	832
File Size	1382311
Page Count	4
File Format	PDF
ISBN	9781467307864
e-ISBN	9781467307888
DOI	10.1109/ICQR2MSE.2012.6246356
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-15
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Degradation Goodness of fit test Life estimation Inspection Accelerated degradation Reliability engineering Acceleration Single sampling inspection Stress Smart meter
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Reliability assessment of degradation product based on accelerated factor

Vibration effects on parameter stability of quartz flexible accelerometer by accelerated test

Notice of RetractionAccelerated degradation demonstration test method based on Gamma process models

Methods on reliability estimation and mechanism consistency test for accelerated degradation data

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling.

Integral estimation method of constant stress accelerated test data under periodic inspection

Research on reliability assessment of the smart meter

Accelerated-Test Procedures for Semiconductor Components

Life estimation of analog IC based on accelerated degradation testing

Single sampling inspection method of smart meter according to reliable life

Similar Documents

Reliability assessment of degradation product based on accelerated factor

Vibration effects on parameter stability of quartz flexible accelerometer by accelerated test

Notice of RetractionAccelerated degradation demonstration test method based on Gamma process models

Methods on reliability estimation and mechanism consistency test for accelerated degradation data

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling.

Integral estimation method of constant stress accelerated test data under periodic inspection

Research on reliability assessment of the smart meter

Accelerated-Test Procedures for Semiconductor Components

Life estimation of analog IC based on accelerated degradation testing

Single sampling inspection method of smart meter according to reliable life