NDLI: Numerical analysis of an all-optical logic XOR gate based on an active MZ interferometer

Content Provider	IEEE Xplore Digital Library
Author	Nielsen, M.L. Mork, J. Fjelde, T. Dagens, B.
Copyright Year	2002
Description	Author affiliation: Res. Center COM, Tech. Univ. Denmark, Lyngby, Denmark (Nielsen, M.L.; Mork, J.)
Abstract	Summary form only given. A vital issue for practical implementation of optical XOR gates is the tolerance of the gate towards imperfect synchronism of the two signals participating in the XOR operation, as well as the tolerance towards variations of the signal pulse widths. These issues are investigated numerically for a Mach-Zehnder interferometer (MZI) based XOR gate. For bit-rates up to 40 Gb/s, the synchronization tolerance of a MZI XOR gate is determined by the pulse width for RZ format. For the NRZ format, the tolerance decreases as the rise/fall-time approaches the timeslot. The gate is found to be very tolerant towards differences in the RZ pulse width.
Sponsorship	IEEE/Lasers & Electro-Opt. Soc. OSA-Opt. Soc. America Quantum Electron. Div. Eur. Phys. Soc. Opt. Soc. Japanese Quantum Electron. Joint Group
Starting Page	608
Ending Page	609
File Size	223908
Page Count	2
File Format	PDF
ISBN	1557527067
DOI	10.1109/CLEO.2002.1034382
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-05-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Optical Soc. of America
Subject Keyword	Space vector pulse width modulation Integrated optics Optical interferometry Numerical analysis Optical wavelength conversion Logic gates Circuit stability Optical signal processing Delay High speed optical techniques
Content Type	Text
Resource Type	Article

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