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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Vierhaus, H.T. |
| Copyright Year | 2013 |
| Description | Author affiliation: BTU Cottbus, Cottbus, Germany (Vierhaus, H.T.) |
| Abstract | With decreasing minimum feature size, nano-electronic circuits and systems exhibit an increasing variety of defect and fault mechanisms. Their rising sensitivity to radiation- and coupling induced single and multiple event upsets is one problem, new or enhanced aging processes that may lead to early-lifetime failures pose another threat. The compensation of transient fault effects is a well explored are of science, while repair technologies that tackle permanent faults have so far found a broad acceptance only for embedded memories and for FPGA-based systems. However, specifically such methods and architectures are of great practical importance for the compensation of early-lifetime failures. The combination of fast error compensation and repair mechanisms is even more challenging, since also aspects of minimum power consumption become important in many areas of application. |
| Sponsorship | IEEE Poland Sect. CAS Chapt. |
| Starting Page | 12 |
| Ending Page | 18 |
| File Size | 651568 |
| Page Count | 7 |
| File Format | |
| ISBN | 9788362065172 |
| ISSN | 23260319 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-09-26 |
| Publisher Place | Poland |
| Access Restriction | Subscribed |
| Rights Holder | Poznan Univ of Technology |
| Subject Keyword | Switches Maintenance engineering Tunneling magnetoresistance Circuit faults Transistors Transient analysis Clocks |
| Content Type | Text |
| Resource Type | Article |
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