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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kanai, T. Takao, K. Shinohe, T. Tanaka, Y. Yamaguchi, H. Ohashi, H. Akiyama, H. Sung, K. Wada, K. |
| Copyright Year | 2010 |
| Description | Author affiliation: Tokyo Metropolitan University, 1-1 Minami Osawa, Hachioji, Tokyo, Japan (Wada, K.) || Corporative Research & Development Center, Toshiba Corporation, 1. Komukai-Toshiba-cho, Saiwaiku, Kawasaki, Japan (Takao, K.; Shinohe, T.) || National Institute of Advanced Industrial Science and Technology, 1-1-1, Umezono, Tsukuba, Ibaraki, Japan (Tanaka, Y.; Yamaguchi, H.; Ohashi, H.) || Toshiba Mitsubishi-Electric Industrial System Corporation, 1. Toshiba-cho, Fuchu, Tokyo, Japan (Kanai, T.) || Ibaraki National College of Technology, 866 Nakane, Hitachinaka, Ibaraki, Japan (Akiyama, H.; Sung, K.) |
| Abstract | High-switching-frequency operation is essential for reducing the size and weight of LC filters in mediumvoltage power converters. In this work, hybrid pairs of 6 kV SiC-PiN diodes and 4.5 kV Si-IEGTs have been applied to realize the high-switching-frequency operation. A gate-driving technique with an extremely low gate resistance called hard gate driving is employed for low switching losses of the hybrid pair. 100 A class hybrid pair modules are fabricated and their high-speed switching characteristics have been evaluated. By using the developed hybrid pair module, high switching frequency operation more than 2 kHz have been demonstrated in a prototype power converters. |
| Starting Page | 3259 |
| Ending Page | 3265 |
| File Size | 1414570 |
| Page Count | 7 |
| File Format | |
| ISBN | 9781424453948 |
| e-ISBN | 9781424453931 |
| DOI | 10.1109/IPEC.2010.5543707 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-06-21 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Switching converters Power electronics Semiconductor diodes IEGT Stress Degradation PiN diode Filters Silicon carbide Switching frequency Switching loss Medium voltage Medium-voltage power converter Testing |
| Content Type | Text |
| Resource Type | Article |
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