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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Tsung-Han Tsai Chin-Yu Huang Jun-Ru Chang |
| Copyright Year | 2009 |
| Abstract | During the software development process, data that has been gained from the testing phase can help developers to predict software reliability more precisely. But the testing stage usually takes more and more effort due to the growing complexity of software. How to build software that can be tested efficiently has become an important topic in addition to enhancing and developing new testing methods. Thus, research on software testability has been developed variously. In the past, a dynamic technique for estimating program testability was proposed and called propagation, infection, and execution (PIE) analysis. Previous research studies show that PIE analysis can complement software testing. However, this technique requires a lot of computational overhead in estimating the testability of software components. In this paper, we propose an Extended PIE (EPIE) technique to accelerate the traditional PIE analysis, based on generating group testability as a substitute for location testability. This technique can be separated into three steps: breaking a program into blocks, dividing blocks into groups, and marking target statements. We developed a tool called ePAT (extended PIE Analysis Tool) to help us identify the locations which will be analyzed. The experimental results show that the number of analyzed locations can be effectively decreased and that the estimated value of testability remains acceptable and useful. |
| Starting Page | 89 |
| Ending Page | 98 |
| File Size | 345368 |
| Page Count | 10 |
| File Format | |
| ISBN | 9780769537269 |
| ISSN | 07303157 |
| DOI | 10.1109/COMPSAC.2009.22 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-07-20 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Software testing Programming Application software System testing Information analysis Failure analysis Computer applications Computer science Information systems Computer industry software testing testability |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Science Applications Software |
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