NDLI: Special features in electronic circuits modeling for fail-safe use

Content Provider	IEEE Xplore Digital Library
Author	Stoytcheva, N. Georgieva, M.
Copyright Year	2003
Description	Author affiliation: Dept. of Commun. & Safety Syst., "Todor Kableshkov" Higher Sch. of Transp., Sofia, Bulgaria (Stoytcheva, N.; Georgieva, M.)
Abstract	Reliability engineering is becoming increasingly important as we all become increasingly dependent on advanced technology. Consumers want technology, as they want technology that works. Today advanced electronic equipment is used in telecommunication, medical equipment, transportation, railway and similar critical functions. An important issue is the increasing use of complex digital circuitry in safety critical systems and the implications regarding safety assessment. In railway industry the use of ASICs, microprocessors, gate arrays and other highly complex digital devices is seen as a means to provide increased functionality as lower cost with higher reliability and safety. The model must be changed to reflect the modification because of new system elements replace older elements, adding new functions and capabilities. The purpose of the paper is to propose a method for modeling the fail-safe behavior of new conventional electronic scheme for safety-critical applications. The traditional approach as well as the known up to now principles and methods of safety systems synthesis has not solved that problem. A new safety conception has established itself - safety to be looked for on system level instead of on element level. This has considerably changed the modeling principles and methods including even some terms determined for many decades.
Starting Page	169
Ending Page	172
File Size	240148
Page Count	4
File Format	PDF
ISBN	0780380029
DOI	10.1109/ISSE.2003.1260508
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-05-08
Publisher Place	Slovakia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electronic circuits Safety Very large scale integration Aerospace electronics Control systems Application software Accidents Biomedical engineering Reliability engineering Electronic equipment
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Enhancing ASICs reliability through the use of fault secure fail-safe multiplexer

Impact of VLSI Circuits on Automotive Electronics

The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

Comparing fail-safe microcontroller architectures in light of IEC 61508

Integrated systems

The use of CAD systems for investigation of electronic circuits reliability and safety and their application in education

Achieving the enhanced reliability of electronic system by application of EMI control measures

Custom pin electronics for VLSI automatic test equipment

Behavioral design and prototyping of a fail-safe system

Special features in electronic circuits modeling for fail-safe use

Similar Documents

Enhancing ASICs reliability through the use of fault secure fail-safe multiplexer

Impact of VLSI Circuits on Automotive Electronics

The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

Comparing fail-safe microcontroller architectures in light of IEC 61508

Integrated systems

The use of CAD systems for investigation of electronic circuits reliability and safety and their application in education

Achieving the enhanced reliability of electronic system by application of EMI control measures

Custom pin electronics for VLSI automatic test equipment

Behavioral design and prototyping of a fail-safe system

Special features in electronic circuits modeling for fail-safe use