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Content Provider | IEEE Xplore Digital Library |
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Author | Tao, M.W. Hadap, S. Malik, J. Ramamoorthi, R. |
Copyright Year | 2013 |
Description | Author affiliation: Univ. of California, Berkeley, Berkeley, CA, USA (Tao, M.W.; Malik, J.; Ramamoorthi, R.) |
Abstract | Light-field cameras have recently become available to the consumer market. An array of micro-lenses captures enough information that one can refocus images after acquisition, as well as shift one's viewpoint within the sub-apertures of the main lens, effectively obtaining multiple views. Thus, depth cues from both defocus and correspondence are available simultaneously in a single capture. Previously, defocus could be achieved only through multiple image exposures focused at different depths, while correspondence cues needed multiple exposures at different viewpoints or multiple cameras, moreover, both cues could not easily be obtained together. In this paper, we present a novel simple and principled algorithm that computes dense depth estimation by combining both defocus and correspondence depth cues. We analyze the x-u 2D epipolar image (EPI), where by convention we assume the spatial x coordinate is horizontal and the angular u coordinate is vertical (our final algorithm uses the full 4D EPI). We show that defocus depth cues are obtained by computing the horizontal (spatial) variance after vertical (angular) integration, and correspondence depth cues by computing the vertical (angular) variance. We then show how to combine the two cues into a high quality depth map, suitable for computer vision applications such as matting, full control of depth-of-field, and surface reconstruction. |
Sponsorship | IEEE Comput. Soc. |
Starting Page | 673 |
Ending Page | 680 |
File Size | 2228667 |
Page Count | 8 |
File Format | |
ISBN | 9781479928408 |
ISSN | 15505499 |
DOI | 10.1109/ICCV.2013.89 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2013-12-01 |
Publisher Place | Australia |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Cameras Estimation Apertures Lenses Three-dimensional displays Noise measurement Robustness |
Content Type | Text |
Resource Type | Article |
Subject | Computer Vision and Pattern Recognition Software |
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