NDLI: Minimum measurements at minimum set of test nodes for analog circuit fault diagnosis

Content Provider	IEEE Xplore Digital Library
Author	Abu Ei-Yazeed, M.F.
Copyright Year	2002
Description	Author affiliation: Dept. of Electron. & Commun., Cairo Univ., Giza, Egypt (Abu Ei-Yazeed, M.F.)
Abstract	A new technique for isolating all separable hard faults in analog circuits using minimum measurements at a minimum pre-selected set of test nodes is presented. The spectrum of the circuit response to a sinusoidal input test signal is simulated at all circuit nodes. A clustering algorithm is then applied to evaluate the separability performance of all simulated measurements. Uniquely classified faults are isolated each in one set while faults having similar responses are grouped in one ambiguity set. The proposed algorithm is then applied in two consequent steps. In the first step, selection of an optimal minimal set of test nodes is achieved. In the second step, selection of minimum measurements at the pre-selected set of test nodes is realized. The resultant overall classification accuracy is comparable to that obtained using all measurements at all circuit nodes. The proposed strategy is demonstrated with a three-stage active filter circuit example. Moreover, classification results are verified using a learning vector quantization neural network.
Starting Page	510
Ending Page	516
File Size	677141
Page Count	7
File Format	PDF
ISBN	0780375270
DOI	10.1109/MELECON.2002.1014645
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-05-07
Publisher Place	Egypt
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Analog circuits Fault diagnosis Circuit faults Circuit simulation Dictionaries Electronic equipment testing Integrated circuit measurements Clustering algorithms Active filters
Content Type	Text
Resource Type	Article

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