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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ghosh, A. Achutha, S. Heidrich, W. O'Toole, M. |
| Copyright Year | 2007 |
| Description | Author affiliation: Univ. of British Columbia, Vancouver (Ghosh, A.; Achutha, S.; Heidrich, W.; O'Toole, M.) |
| Abstract | Realistic descriptions of surface reflectance have long been a topic of interest in both computer vision and computer graphics research. In this paper, we describe a novel and fast approach for the acquisition of bidirectional reflectance distribution functions (BRDFs). We develop a novel theory for directly measuring BRDFs in a basis representation by projecting incident light as a sequence of basis functions from a spherical zone of directions. We derive an orthonormal basis over spherical zones that is ideally suited for this task. BRDF values outside the zonal directions are extrapolated by re-projecting the zonal measurements into a spherical harmonics basis, or by fitting analytical reflection models to the data. We verify this approach with a compact optical setup that requires no moving parts and only a small number of image measurements. Using this approach, a BRDF can be measured in just a few minutes. |
| Starting Page | 1 |
| Ending Page | 8 |
| File Size | 9819779 |
| Page Count | 8 |
| File Format | |
| ISBN | 9781424416301 |
| ISSN | 15505499 |
| DOI | 10.1109/ICCV.2007.4408935 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-10-14 |
| Publisher Place | Brazil |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Lighting Reflectivity Optical filters Analytical models Optical noise Light sources Computer vision Computer graphics Bidirectional control Distribution functions |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Vision and Pattern Recognition Software |
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