NDLI: In-situ observation of electrode melting in multilayer-ceramic capacitors

Content Provider	IEEE Xplore Digital Library
Author	Ling, H.C. Chang, D.D.
Copyright Year	1988
Description	Author affiliation: AT&T Eng. Res. Center, Princeton, NJ, USA (Ling, H.C.; Chang, D.D.)
Abstract	Observations on sectioned and polished multilayer ceramic capacitors, which were subjected to controlled current-surge test conditions, are presented. Capacitors from several vendors were examined in situ under an optical microscope while current pulses of varying magnitude were applied at a constant voltage. Subsequently, some samples were further examined by scanning electron microscopy (SEM). The failure mechanism appeared to be the heat-induced local melting of internal electrodes, leading to blow-out or charring of the capacitor. In less severe cases, local melting and crack formation in the surrounding ceramic was observed. The primary change in capacitor properties was in the degradation of the insulation resistance (IR). In severe cases, this also led to an increase in the dissipation factor (DF).<>
Starting Page	87
Ending Page	94
File Size	725234
Page Count	8
File Format	PDF
DOI	10.1109/ECC.1988.12574
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1988-05-09
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electrodes Capacitors Scanning electron microscopy Ceramics Optical microscopy Nonhomogeneous media Testing Electron optics Optical pulses Voltage
Content Type	Text
Resource Type	Article

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