NDLI: The integrated error against log frequency (IELF) method for CEM validation

Content Provider	IEEE Xplore Digital Library
Author	Simpson, R.J. Jones, C.R. MacDiarmid, I. Duffy, A. Coleby, D.
Copyright Year	2005
Description	Author affiliation: Simtronics Ltd., Preston, UK (Simpson, R.J.)
Abstract	Data with a high feature density is common within EMC measurements and modeling, particularly in the complex and substantially overmoded environments found in aerospace EMC environments. Comparison of experimental and modeled data based on visual assessment of the graphical representation of the data is common and requires both extensive experience and detailed system knowledge in order to be able to interpret the comparisons with confidence. However, in circumstances where a quantification of this comparison is called for, such as when sharing results across partner organizations, obtaining a single representative figure of merit is challenging. The integrated error against log frequency (IELF) method was developed to provide this quantification. It is based on the view that the most significant aspect of the data to be compared is a function of the difference between the two traces being compared, particularly when the individual features are difficult to discriminate. This paper presents the IELF method and demonstrates its potential.
Starting Page	296
Ending Page	300
File Size	522521
Page Count	5
File Format	PDF
ISBN	0780393805
DOI	10.1109/ISEMC.2005.1513517
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-08-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Frequency Electromagnetic compatibility Density measurement Particle measurements Computational electromagnetics Bandwidth Equations
Content Type	Text
Resource Type	Article

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