NDLI: Estimation of current from near-field measurement

Content Provider	IEEE Xplore Digital Library
Author	Haixiao Weng Beetner, D.G. DuBroff, R.E. Jin Shi
Copyright Year	2005
Description	Author affiliation: Lab. of Electromagn. Compatibility, Missouri Univ., USA (Haixiao Weng; Beetner, D.G.; DuBroff, R.E.; Jin Shi)
Abstract	Knowledge of high-frequency currents in the chip and chip-package are necessary for EMI analysis and prediction, though measurement of these currents may be difficult to obtain in many cases. One possibility is to estimate currents from near-field scan data. In this paper, measurements were made of the magnetic field over a simple circuit and a chip package. The current flowing in the circuit and the chip lead frame was estimated from the compensated near-field data and compared with measurements made directly on the pins. Estimation was performed both with and without structural information of the lead frame. The susceptibility of estimated currents to measurement errors was analyzed. Results show this technique can be a powerful tool for analyzing high frequency chip currents.
Starting Page	222
Ending Page	227
File Size	769786
Page Count	6
File Format	PDF
ISBN	0780393805
DOI	10.1109/ISEMC.2005.1513504
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-08-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Current measurement Magnetic field measurement Semiconductor device measurement Electromagnetic interference Magnetic analysis Magnetic circuits Packaging Pins Measurement errors Error analysis
Content Type	Text
Resource Type	Article

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