NDLI: Application independent evaluation of electromagnetic emissions for integrated circuits by the measurement of conducted signals

Content Provider	IEEE Xplore Digital Library
Author	Pfaff, W.R.
Copyright Year	1998
Description	Author affiliation: Robert Bosch GmbH, Stuttgart, Germany (Pfaff, W.R.)
Abstract	This paper gives measurement methods to evaluate the electromagnetic emission (EME) of integrated circuits (IC). The effect of disturbances of any ICs depend on design and layout of the application the specific integrated circuit is built in. To evaluate the EME behavior independent from the final application the proposed methods apply conducted signals, the RF-voltage at any pin and the so called sum current in the mass system of the IC. For the measurement the IC to be evaluated is built up in a very simplified circuitry on a PCB with a standardized layout. Using the proposed qualification scheme for the measured signals it is possible to give EME parameters for standard ICs in the data book or in application notes. On the other hand the user can evaluate the necessary limits for its specific application and give them to its supplier as a specification. On this base the supplier is able to perform investigations and to fulfil the specification without the knowledge of the final application. In the paper the principles of the measurement of the RF-voltage and of the RF-current are described. Examples show for a microprocessor circuit and standard logic circuits that it is possible to evaluate very clearly the influence of different designs of ICs, e.g. for EMI-improvement.
Starting Page	219
Ending Page	224
File Size	433639
Page Count	6
File Format	PDF
ISBN	0780350154
DOI	10.1109/ISEMC.1998.750089
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-08-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Application specific integrated circuits Integrated circuit layout Integrated circuit measurements Electromagnetic measurements Current measurement Qualifications Measurement standards Books Microprocessors Logic circuits
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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