NDLI: Using statistics to reduce the uncertainty in system level susceptibility testing

Content Provider	IEEE Xplore Digital Library
Author	Jennings, P. Ball, R. Lever, P.
Copyright Year	1997
Description	Author affiliation: Adv. Technol. Centre, Warwick Univ., Coventry, UK (Jennings, P.; Ball, R.; Lever, P.)
Abstract	Products containing electronics must generally be tested for electromagnetic susceptibility, as part of their EMC certification process, at the end of their development cycle to ensure that the test is representative of any future use of the product. However, the earlier that the product as a whole, or the electronic systems that might form part of the product, can be tested for susceptibility, the more benefit can be gained from such a procedure. Both a saving in time and cost can be achieved in the product development process. This paper describes a statistical technique which has been developed for use in the automotive industry with a bulk current injection (BCI) test. It has been designed to help overcome the uncertainties in correlating results from such a system-level bench test with results from the final vehicle-level sign-off test carried out in a full-threat field within a semi-anechoic EMC chamber. The technique uses a probability distribution function with the mean transfer function and its standard deviation to estimate the risk of the test system, once installed in a vehicle, malfunctioning when that vehicle is exposed to radiation of a particular field strength and frequency. The effect of vehicle body dimensions on these risk figures has been examined and a simple mathematical model using statistical input data has been produced which shows some agreement with the measured data.
Starting Page	47
Ending Page	50
File Size	391704
Page Count	4
File Format	PDF
ISBN	0780336089
DOI	10.1109/ISEMC.1995.523516
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-08-14
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Statistics Uncertainty Electronic equipment testing System testing Vehicles Electromagnetic compatibility Frequency estimation Certification Costs Product development
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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