NDLI: Test procedure development for automotive conducted susceptibility and conducted emissions

Content Provider	IEEE Xplore Digital Library
Author	Moy, K.P. Sperber, W.
Copyright Year	1989
Description	Author affiliation: General Motors Corp., Warren, OH, USA (Moy, K.P.; Sperber, W.)
Abstract	Current work on electromagnetic compatibility (EMC) requirements for automotive electronic and electrical components has necessitated the development of certain test procedures and specifications for EMC testing within General Motors. In order to support this effort, a study was performed to characterize the internal electromagnetic environment of the automobile. The authors describe the conducted susceptibility and conducted emissions test procedure and specification development in General Motors. The status of the development of similar test procedures in the Society of Automotive Engineers and International Standard Organization is also discussed. The test methods, where possible, harmonize with both national and international standards. Through these procedures correlation of component tests to the automobile's internal electromagnetic environment was established. Confirmation of site-to-site repeatability and device-to-device repeatability was accomplished. Test configurations were defined to ensure test uniformity and repeatability. Waveform severity levels were identified and recommended with the understanding that the final decision for severity-level specifications is the responsibility of the customer. The tests were primarily developed to be used during the design and development stages of components. In such cases, it is recommended that additional analytical methods such as frequency-domain analysis be used.<>
Starting Page	263
Ending Page	270
File Size	487732
Page Count	8
File Format	PDF
DOI	10.1109/NSEMC.1989.37191
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-05-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automotive engineering Electromagnetic compatibility Vehicles Electronic equipment testing ISO standards System testing Automotive electronics Automobiles Manufacturing Electronic components
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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