NDLI: HBM tester parasitic effects on high pin count devices with multiple power and ground pins

Content Provider	IEEE Xplore Digital Library
Author	Chaine, M. Meuse, T. Ashton, R. Henry, L.G. Natarajan, M.T. Barth, J. Ting, L. Gieser, H. Voldman, S. Farris, M. Grund, E. Ward, S. Kelly, M. Gross, V. Narayan, R. Johnson, L. Gaertner, R. Peachey, N.
Copyright Year	2006
Description	Author affiliation: Intel Corp., Santa Clara, CA, USA (Farris, M.) \|\| Texas Instrum., Inc., TX, USA (Ting, L.) \|\| RF Micro Devices, NC, USA (Peachey, N.) \|\| Oryx Instrum. Inc., CA, USA (Grund, E.) \|\| IBM Corp., NY, USA (Voldman, S.) \|\| White Mountain Labs., Phoenix, AZ, USA (Ashton, R.) \|\| LSI Logic Corp., Milpitas, CA, USA (Narayan, R.; Johnson, L.) \|\| Cypress Semicond., CA, USA (Ward, S.) \|\| Green Mountain ESD Labs., VT, USA (Gross, V.) \|\| Barth Electron. Inc., NV, USA (Barth, J.) \|\| Micron Technol., Inc., Boise, ID, USA (Chaine, M.) \|\| Delphi Electron. & Safety, IN, USA (Kelly, M.) \|\| Infineon Technol., Munich, Germany (Gaertner, R.) \|\| Thermo Electron Corp., Lowell, MA, USA (Meuse, T.)
Abstract	A new human body model (HBM) SPICE equivalent lumped element model (LEM) circuit that reproduces parasitic resistance, capacitance and inductance (RLC) tester effects has been used to investigate how the HBM current flows through several different relay-matrix HBM simulators. SPICE analysis shows that unwanted interaction between the simulators RLC parasitics and the IC component could be significantly reduced, if all of the HBM current flowed through the primary ground path and not through parasitic current paths unintentionally built inside the HBM simulators.
Starting Page	354
Ending Page	363
File Size	3727861
Page Count	10
File Format	PDF
ISBN	9781585371150
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-09-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	EOS/ESD Association, Inc.
Subject Keyword	Pins Biological system modeling Circuit testing SPICE Circuit simulation Analytical models Humans RLC circuits Immune system Parasitic capacitance
Content Type	Text
Resource Type	Article

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