NDLI: A high frequency microdischarge detection technique for electrical insulation and capacitors

Content Provider	IEEE Xplore Digital Library
Author	Stopher, J.P. Zirnheld, J.L. Burke, K.M. Dollinger, R.E. Sarjeant, W.J.
Copyright Year	1998
Description	Author affiliation: Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA (Stopher, J.P.)
Abstract	Today's modern electrical devices are increasingly subject to, and must withstand, high frequency stressing. Such stressing contributes to accelerated aging of electrical insulation and has resulted in premature failure of components. In order to understand the aging mechanisms (i.e., microdischarge induced erosion, thermal runaway, etc.) and make valid conclusions regarding the service lifetime of components used under high frequency conditions, the electrical insulation must be examined under those same high frequency conditions as those in which it will be used. Conventional electrical techniques used to detect partial discharges are limited to below 2 kHz applied ac test voltages. A new technique was developed, in order to stress electrical insulation and examine the microdischarge activity for frequencies up to 100 kHz. This technique uses series resonance to achieve a high frequency sinusoidal steady state ac test voltage and a bridge type test cell to detect the resulting microdischarge activity. Experimental discharge traces are consistent with simulations, showing improved source voltage attenuation compared to conventional techniques. In addition, the calibration technique shows a critically damped single pulse per discharge event with a temporal resolution of <0.5 /spl mu/sec. Experimental results are presented.
Starting Page	476
Ending Page	481
File Size	639694
Page Count	6
File Format	PDF
ISBN	078034927X
ISSN	1089084X
DOI	10.1109/ELINSL.1998.694837
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-06-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Frequency Dielectrics and electrical insulation Testing Voltage Fault location Accelerated aging Partial discharges Stress Resonance Steady-state
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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