NDLI: A detailed study on high-voltage capacitor dielectric system under multistress conditions

Content Provider	IEEE Xplore Digital Library
Author	Krishna Moorthy, P.A. Varughese, J.
Copyright Year	1998
Description	Author affiliation: Div. of Insulation, Electr. Res. & Dev. Assoc., Vadodara, India (Krishna Moorthy, P.A.)
Abstract	This paper presents the results of a detailed study conducted using model capacitors and dielectric film to estimate the service life and the interaction behaviour of film and the impregnant. Model capacitors were prepared using films procured from different sources and subjected to accelerated ageing. The working life of HT capacitors at 25/spl deg/C and 50 volts/micron stress is found to be above 30 years. The effect of temperature on the design of the model capacitor is discussed. A relatively new short-term technique of life estimation of film by continuous constant stress application has been studied. A new phenomenon of the formation of liquid-droplets on the film surface in this test was observed. The causes for this are discussed.
Starting Page	456
Ending Page	459
File Size	475434
Page Count	4
File Format	PDF
ISBN	078034927X
ISSN	1089084X
DOI	10.1109/ELINSL.1998.694832
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-06-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Capacitors Life estimation Stress Accelerated aging Conductive films Optical films Dielectrics and electrical insulation Polymer films Life testing Petroleum
Content Type	Text
Resource Type	Article

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