NDLI: Dielectric properties of B-doped CaCu3Ti4O12 ceramics

Content Provider	IEEE Xplore Digital Library
Author	Shengtao Li Yang Yang Wang Hui Jianying Li
Copyright Year	2011
Description	Author affiliation: State Key Lab. of Electr. Insulation & Power Equip., Xi'an Jiaotong Univ., Xi'an, China (Shengtao Li; Yang Yang; Wang Hui; Jianying Li)
Abstract	$CaCu_{3}Ti_{4}O_{12}$ (CCTO) exhibiting high dielectric constants has recently attracted considerable attention because of the high dielectric constant of about $10^{5}$ at radio frequency and good temperature stability over a wide temperature range. But high dielectric loss and low breakdown strength seriously affect its application. $B_{2}O_{3}$ is chosen as glassy phase and it can make grain grow rapidly and decrease the sintering temperature. Meanwhile, $B_{2}O_{3}$ can improve the breakdown strength of CCTO and decrease dielectric loss due to the increase of the density. It can be observed that $B_{2}O_{3}$ precipitate in grain boundaries and increase the resistance of grain boundary. The main $CaCu_{3}Ti_{4}O_{12}$ phase was confirmed by X-ray diffraction, the microstructure with obvious grain and grain boundary structures was observed by scanning electron microscopy. This study indicates that the amount of $B_{2}O_{3}$ can increase the dielectric constant of CCTO keeping $10^{4}$ in the frequency range from $10^{-1}$ Hz to $10^{6}$ Hz and can also decrease the dielectric loss of CCTO since it can increase the resistance of the grain boundary. For the sample doped with 3 wt % $B_{2}O_{3},$ its dielectric constant is stable from $10^{-1}$ Hz to $10^{6}$ Hz, the tanδ decrease to 0.06 compared with 0.7 at 1 kHz of the undoped CCTO sample, and its grain boundary resistance is obvious much bigger than other samples.
Starting Page	482
Ending Page	485
File Size	688181
Page Count	4
File Format	PDF
ISBN	9784886860743
e-ISBN	9784886860743
DOI	10.1109/ISEIM.2011.6826318
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-09-06
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	The Institute of Electrical Engineers, Japan
Subject Keyword	Grain boundaries Resistance Ceramics Dielectric constant Temperature measurement Dielectric losses dielectric loss CCTO dielectric constant B2O3 glass
Content Type	Text
Resource Type	Article

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