NDLI: Constriction Resistance of Thin-Film Contacts

Content Provider	IEEE Xplore Digital Library
Author	Timsit, R.S.
Copyright Year	2008
Description	Author affiliation: Timron Adv. Connector Technol., Timron Sci. Consultinng Inc., Toronto, ON (Timsit, R.S.)
Abstract	The electrical constriction resistance of a circular a-spot in a bulk interface stems from convergence of electrical current flow lines from a distance far from the constriction, and the subsequent spreading out of the current from the constriction. The spreading resistance of an a-spot located in a thin film cannot be identical to that generated in a bulk component of the same material since current spreading is limited in a thin film. This paper addresses the effect of film thickness on spreading resistance, and hence on constriction resistance, in a thin conducting layer. It is shown that the spreading resistance of a circular constriction of radius a located in a cylindrical film of outer radius b and thickness L may be written as $R_{N}$ (rho/ 4a ), where $R_{N}$ is a factor that depends on the ratio L/b and a/b. Calculations indicate that $R_{N}$ deviates from 1 i.e. spreading resistance deviates significantly from that in a bulk solid, only for relatively thin film where L/b is small and for relatively large values of a/b.
Starting Page	332
Ending Page	336
File Size	438747
Page Count	5
File Format	PDF
ISBN	9781424419012
DOI	10.1109/HOLM.2008.ECP.64
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-27
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Contact resistance Transistors Electric resistance Conductive films Conducting materials Solids Equations Boundary conditions Connectors Electric potential
Content Type	Text
Resource Type	Article

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