NDLI: A Method for Power Rating Contacts using Voltage Drop

Content Provider	IEEE Xplore Digital Library
Author	Malucci, R.D. Ruffino, F.R.
Copyright Year	2008
Abstract	A method of using accelerated testing and change in voltage drop (or resistance) after aging is proposed in rating the performance of power contacts. It was shown in previous papers that change in voltage drop exhibits a threshold for stability for various materials. This feature is employed in a method that monitors voltage drop (or resistance) through life testing. Moreover, a statistical model for the end-of-life change in voltage drop is recommended to establish reliability. The steps necessary to achieve this are laid out in terms of material ratings, operating temperatures, accelerated tests, voltage drop measurements and failure criteria. The present paper expands on previous work by extending the analysis of the existing data base. In this case, samples were exposed to thermal aging and current cycling which produced degradation at various current levels. Processes such as stress relaxation, diffusion, electro- migration and oxidation are believed to be accelerated under the conditions used. In this work, several current levels were used to accelerate the progression of degradation at different rates. In addition, these results were analyzed using basic contact theory in conjunction with statistical modeling. Moreover, current density and contact voltage (or contact resistance) are discussed as basic physical parameters that provide links to aging and failure criteria. It was shown how current density can be related to design features and material properties to provide a method to determine change in resistance failure criteria for various designs. It is believed this methodology can be applied to various contact materials to quantify the rating of power contacts.
Starting Page	225
Ending Page	231
File Size	268243
Page Count	7
File Format	PDF
ISBN	9781424419012
DOI	10.1109/HOLM.2008.ECP.48
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-27
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aging Life estimation Contact resistance Thermal degradation Acceleration Current density Threshold voltage Stability Life testing Temperature
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Rating power connectors using voltage drop

Rating Power Connectors Using End-of-Life Voltage Drop

Fretting corrosion degradation, threshold behavior and contact instability [electrical contacts]

Materials Considerations in using Voltage Drop for Power Rating

Fretting corrosion in power contacts: Electrical and thermal analysis

Contact current carrying limits

An experimental investigation of the metal contacts resistance at initial stages of operation

Effects of High Current and Temperature in Power MESFET Metallizations

Mo/TiW contact for VLSI applications

A Method for Power Rating Contacts using Voltage Drop

Similar Documents

Rating power connectors using voltage drop

Rating Power Connectors Using End-of-Life Voltage Drop

Fretting corrosion degradation, threshold behavior and contact instability [electrical contacts]

Materials Considerations in using Voltage Drop for Power Rating

Fretting corrosion in power contacts: Electrical and thermal analysis

Contact current carrying limits

An experimental investigation of the metal contacts resistance at initial stages of operation

Effects of High Current and Temperature in Power MESFET Metallizations

Mo/TiW contact for VLSI applications

A Method for Power Rating Contacts using Voltage Drop