NDLI: Impact of technology scaling on bridging fault detections

Content Provider	IEEE Xplore Digital Library
Author	Semenov, O. Sachdev, M.
Copyright Year	2000
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada (Semenov, O.)
Abstract	It is well known that classical fault models (stuck-at, stuck-open, stuck-on) cover only partially the spectrum of failures in today's integrated circuits (IC). Some realistic failures occurring in the logic circuits have to be considered at physical level and include its electrical behavior. Among these failures, gate-oxide short, floating gate and bridging fault types may produce intermediate voltages difficult to interpret at logic level. This work investigates the influence of bridging faults (BF) between two interconnection lines on logic margin and logic swing of ICs and the sensitivity of ICs realized on four different technologies (0.25 /spl mu/m, 0.35 /spl mu/m, 0.5 /spl mu/m, 1.5 /spl mu/m) to bridging faults. In this work we show that the sensitivity of ICs to BF is increased with the technology scaling. The testing methodology was based on the use of voltage, temperature and frequency as parameters, which influence the behavior of ICs with BF.
Starting Page	199
Ending Page	203
File Size	514450
Page Count	5
File Format	PDF
ISBN	0780359577
ISSN	08407789
DOI	10.1109/CCECE.2000.849698
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-05-07
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault detection Circuit faults Integrated circuit modeling Voltage Integrated circuit technology Electrical fault detection Logic circuits Integrated circuit interconnections Testing Temperature sensors
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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