NDLI: Selection of failure time within test time interval for group reliability data analysis

Content Provider	IEEE Xplore Digital Library
Author	Guan Zhang Cher Ming Tan
Copyright Year	2000
Description	Author affiliation: Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore (Guan Zhang)
Abstract	Group reliability data are common in reliability test. In the parameter estimation for group data, probability plotting is usually considered as a simple and fast method. When the interval times are small, the mid-point of test time intervals is heuristically considered as the failure time of those devices that failed during the time interval, especially for the group data with different inspection interval. The upper endpoint of test time interval is another alternative when the units under consideration have a common inspection schedule and all unfailed units have run beyond all failed units. However, the accuracy of the estimation in considering the mid-point or endpoint of the test time interval has not been evaluated rigorously. The effect of sample size, the width of the test time interval, and the life distribution of the devices on the accuracy of the estimation have not been investigated. From this study, we find that, for different distributions, different selection of failure time will affect the accuracy of estimated parameters. In order to have maximum accuracy in parameter estimation, an optimum time point within test time interval is proposed for different distribution. Here probability plotting is used for analyzing singly censored group data with common inspection schedule. Relative error of the estimated parameters is used to determine the estimation accuracy with respect to selected failure time within a test time interval for group data analysis. Three common types of life distributions, namely the exponential, normal and lognormal distributions, are investigated.
Starting Page	98
Ending Page	102
File Size	729768
Page Count	5
File Format	PDF
ISBN	0780359577
ISSN	08407789
DOI	10.1109/CCECE.2000.849678
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-05-07
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Data analysis Parameter estimation Inspection Reliability engineering Maximum likelihood estimation Data engineering Electronic equipment testing Life testing Life estimation Product design
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Maximum Likelihood Estimation For The 2-Parameter Weibull Distribution Based On Interval-Data

Maximum likelihood analysis of component reliability using masked system life-test data

Life Data Analysis for Units Inspected Once for Failure (Quantal-Response Data)

Accelerated life-tests for intermittent destructive inspection, with logistic failure-distribution

Parameter Estimation with Noncontinuous Inspection

Likelihood Inference for Life Test Data

Optimum constant-stress accelerated life-test plans

Maximum likelihood estimates, from censored data, for mixed-Weibull distributions

Estimation of Weibull Parameters With Competing-Mode Censoring

Selection of failure time within test time interval for group reliability data analysis

Similar Documents

Maximum Likelihood Estimation For The 2-Parameter Weibull Distribution Based On Interval-Data

Maximum likelihood analysis of component reliability using masked system life-test data

Life Data Analysis for Units Inspected Once for Failure (Quantal-Response Data)

Accelerated life-tests for intermittent destructive inspection, with logistic failure-distribution

Parameter Estimation with Noncontinuous Inspection

Likelihood Inference for Life Test Data

Optimum constant-stress accelerated life-test plans

Maximum likelihood estimates, from censored data, for mixed-Weibull distributions

Estimation of Weibull Parameters With Competing-Mode Censoring

Selection of failure time within test time interval for group reliability data analysis