NDLI: Structural and electrical characterization of films of La-modified Pb(Zr/sub x/Ti/sub 1-x/)O/sub 3/ prepared by sol-gel technique

Content Provider	IEEE Xplore Digital Library
Author	Vijayaraghavan, M.C. Goel, T.C. Pillai, P.K.C. Mendiratta, R.G.
Copyright Year	1996
Description	Author affiliation: Dept. of Phys., Indian Inst. of Technol., Delhi, India (Vijayaraghavan, M.C.)
Abstract	La modified Pb(Zr/sub x/Ti/sub 1-x/)O/sub 3/ films of 8/65/35 composition were deposited by spin coating from a PLZT sol prepared by dissolving the corresponding precursors in methoxyethanol. As deposited films were amorphous. A thin film of PbTiO/sub 3/ was deposited on the substrate prior to depositing PLZT films to enhance the crystallinity and tetragonal nature of the PLZT films. After multiple coating, these films were heat treated at different temperatures. While films fired at 400/spl deg/C were still amorphous, crystallinity was achieved on firing the films at 600/spl deg/C. Dielectric studies have been performed to understand the temperature and frequency dependence of dielectric permittivity and loss in these films. Results of ferroelectric studies are also reported. The crystalline films exhibit P-E hysteresis loops.
Starting Page	891
Ending Page	896
File Size	312588
Page Count	6
File Format	PDF
ISBN	0780326954
DOI	10.1109/ISE.1996.578228
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-09-27
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Ferroelectric films Crystallization Dielectric losses Coatings Amorphous materials Dielectric substrates Dielectric thin films Sputtering Temperature Firing
Content Type	Text
Resource Type	Article

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