NDLI: Sentomist: Unveiling Transient Sensor Network Bugs via Symptom Mining

Content Provider	IEEE Xplore Digital Library
Author	Yangfan Zhou Xinyu Chen Lyu, M.R. Jiangchuan Liu
Copyright Year	2010
Abstract	Wireless Sensor Network (WSN) applications are typically event-driven. While the source codes of these applications may look simple, they are executed with a complicated concurrency model, which frequently introduces software bugs, in particular, transient bugs. Such buggy logics may only be triggered by some occasionally interleaved events that bear implicit dependency, but can lead to fatal system failures. Unfortunately, these deeply-hidden bugs or even their symptoms can hardly be identified by state-of-the-art debugging tools, and manual identification from massive running traces can be prohibitively expensive. In this paper, we present Sentomist (Sensor application anatomist), a novel tool for identifying potential transient bugs in WSN applications. The Sentomist design is based on a key observation that transient bugs make the behaviors of a WSN system deviate from the normal, and thus outliers (i.e., abnormal behaviors) are good indicators of potential bugs. Sentomist introduces the notion of event-handling interval to systematically anatomize the long-term execution history of an event-driven WSN system into groups of intervals. It then applies a customized outlier detection algorithm to quickly identify and rank abnormal intervals. This dramatically reduces the human efforts of inspection (otherwise, we have to manually check tremendous data samples, typically with brute force inspection) and thus greatly speeds up debugging. We have implemented Sentomist based on the concurrency model of TinyOS. We apply Sentomist to test a series of representative real-life WSN applications that contain transient bugs. These bugs, though caused by complicated interactions that can hardly be predicted during the programming stage, are successfully confined by Sentomist.
Starting Page	784
Ending Page	794
File Size	451076
Page Count	11
File Format	PDF
ISBN	9781424472611
ISSN	10636927
e-ISBN	9781424472628
DOI	10.1109/ICDCS.2010.75
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-21
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Computer bugs Wireless sensor networks Application software Concurrent computing Debugging Inspection Logic History Detection algorithms Humans Embedded Systems Sensor Networks Testing
Content Type	Text
Resource Type	Article
Subject	Computer Networks and Communications Hardware and Architecture Software

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Sentomist: unveiling transient sensor network bugs via symptom mining.

Sentomist: Unveiling transient sensor network bugs via symptom mining,” http://www.cse.cuhk.edu.hk/∼yfzhou/Sentomist

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Sentomist: Unveiling Transient Sensor Network Bugs via Symptom Mining

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Sentomist: unveiling transient sensor network bugs via symptom mining.

Sentomist: Unveiling transient sensor network bugs via symptom mining,” http://www.cse.cuhk.edu.hk/∼yfzhou/Sentomist

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