NDLI: Dielectric surface flashover in vacuum at 100 K

Content Provider	IEEE Xplore Digital Library
Author	Neuber, A. Butcher, M. Hatfield, L.L. Kristiansen, M. Krompholz, H.
Copyright Year	1998
Description	Author affiliation: Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA (Neuber, A.)
Abstract	Cryogenic components in high power electrical systems and in power electronics gain more and more importance. The behavior of insulators under cryogenic conditions, however, is virtually unknown. In a fast coaxial setup, a dielectric test sample and electrodes in a vacuum are cooled to less than 100 K and the flashover development process is characterized using fast electrical and optical diagnostics. Three consecutive development stages for flashover in self-breakdown mode with a gap distance of 0.5 cm can be distinguished: (1) a fast current rise to mA-amplitudes within several nanoseconds which is probably associated with field emission, followed by; (2) a slow current rise to ampere-amplitudes with a duration of several 10's to 100's of nanoseconds associated with secondary emission avalanche saturation; and (3) a transition to a rapid gaseous ionization above the sample caused by electron induced outgassing, leading to impedance-limited current amplitudes of several 100 A. The temperature dependence of these three stages is investigated for different materials. Phase (1) shows a higher final current at lower temperature, which is probably due to a higher initial velocity of the secondary electrons, the duration of phase (2) is a decreasing function of breakdown voltage and only slightly different for low and room temperature, which points to a weak temperature dependence of the outgassing process. Flashover potentials show a slight increase at lower temperature, in general.
Starting Page	815
Ending Page	818
File Size	434855
Page Count	4
File Format	PDF
ISBN	0780339533
ISSN	10932941
DOI	10.1109/DEIV.1998.738898
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-08-17
Publisher Place	Netherlands
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Flashover Temperature dependence Cryogenics Temperature distribution Vacuum systems Power electronics Dielectrics and electrical insulation Coaxial components Testing Electrodes
Content Type	Text
Resource Type	Article
Subject	Computer Networks and Communications Software

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