NDLI: Spin Precession in Oblique Magnetic Fields

Content Provider	IEEE Xplore Digital Library
Author	Jing Li Biqin Huang Appelbaum, I.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Univ. of Delaware, Newark, DE (Jing Li; Biqin Huang; Appelbaum, I.)
Abstract	The authors have measured spin precession from devices with 350 micron-thick undoped silicon transport layers in an oblique magnetic field synthesized by a static magnetic field $B_{par}$ and a varied magnetic field $B_{perp}.$ Experimental results of spin precession, measured by changing the fixed in-plane magnetic field magnitude at zero device misalignment are also presented. Repeating this study at a fixed device misalignment angle of 30 degrees is also shown as is holding the fixed field constant at different misalignment angles is shown . The authors modeled the device spin detector current using a drift-diffusion model which in linear response is proportional to the projection of final spin direction (after transport) on the measurement axis determined by detector magnetization. Under the influence of an oblique magnetic field, spin is induced to precess around the magnetic field, which produces asymmetric Hanle curves (due to broken symmetry of spin direction or spin precession chirality, or both) that are different from those measured in single-axis magnetic fields. The simulated spin precession measurements are presented and compared favorably to the experimental data . In conclusion, the Hanle spin precession signal is suppressed when a fixed in-plane magnetic field is used in conjunction with a varied magnetic field perpendicular to the plane of the spin-transport device, and the signal becomes asymmetric when the device is misaligned with respect to magnetic fields.
Starting Page	221
Ending Page	222
File Size	730087
Page Count	2
File Format	PDF
ISBN	9781424419425
ISSN	15483770
DOI	10.1109/DRC.2008.4800812
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-06-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic fields Magnetic field measurement Detectors Bismuth Magnetic circuits Electrons Electric variables measurement Testing Magnetic modulators Silicon
Content Type	Text
Resource Type	Article

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