NDLI: Detection and Correction Process Modeling Considering the Time Dependency

Content Provider	IEEE Xplore Digital Library
Author	Wu, Y.P. Hu, Q.P. Xie, M. Ng, S.H.
Copyright Year	2006
Description	Author affiliation: Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore (Wu, Y.P.; Hu, Q.P.; Xie, M.; Ng, S.H.)
Abstract	Most of the models for software reliability analysis are based on reliability growth models which deal with the fault detection process only. In this paper, some useful approaches to the modeling of both software fault detection and fault correction processes are discussed. Since the estimation of model parameters in software testing is essential to give accurate prediction and help make the right decision about software release, the problem of estimating the parameters is addressed. Taking into account the dependency between the fault correction process and the fault detection process, a new explicit formula for the likelihood function is derived and the maximum likelihood estimates are obtained under various time delay assumptions. An actual set of data from a software development project is used as an illustrative example. A Monte Carlo simulation is carried out to compare the predictive capability between the LSE method and the MLE method
Sponsorship	IEEE Comput. Soc. TC on Fault-Tolerant Comput. Univ. of California, Riverside
Starting Page	19
Ending Page	25
File Size	369379
Page Count	7
File Format	PDF
ISBN	0769527248
DOI	10.1109/PRDC.2006.27
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-12-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault detection Parameter estimation Maximum likelihood estimation Software reliability Predictive models Software testing Maximum likelihood detection Delay estimation Delay effects Programming
Content Type	Text
Resource Type	Article

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