NDLI: A Practical Approach to Single Event Transients Analysis for Highly Complex Designs

Content Provider	IEEE Xplore Digital Library
Author	Alexandrescu, D. Costenaro, E. Nicolaidis, M.
Copyright Year	2011
Abstract	Single Event Transients are considerably more difficult to model, simulate and analyze than the closely-related Single Event Upsets. The work environment may cause a myriad of distinctive transient pulses in various cell types that are used in widely different configurations. We present practical methods to help characterizing the standard cell library using dedicated tools and results from radiation testing. Furthermore, we analyze the SET propagation in logic networks using a standard (reference) serial fault simulation approach and an accelerated fault simulation technique, taking in account both logic and temporal considerations. The accelerated method provides similar results as the reference approach while offering a considerable increase in the simulation speed. However, the simulation approach may not be feasible for large (multi-million cells) designs that could benefit from static analysis methods. We benchmark the results of a static, probabilistic approach against the reference and accelerated methods. Finally, we discuss the integration of the SET analysis in a complete Soft Error Rate analysis flow.
Starting Page	155
Ending Page	163
File Size	293008
Page Count	9
File Format	PDF
ISBN	9781457717130
ISSN	15505774
DOI	10.1109/DFT.2011.18
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-10-03
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Libraries Transient analysis Transistors Flip-flops Analytical models Integrated circuit modeling fault propagation Single Event Effects Single Event Transient accelerated fault simulation static fault analysis
Content Type	Text
Resource Type	Article

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