NDLI: A TE/sub 011+/spl delta// mode sapphire resonator probe for accurate characterization of microwave surface resistance of HTS thin films

Content Provider	IEEE Xplore Digital Library
Author	Jian Lu Xiangyang Ren Qishao Zhang
Copyright Year	1994
Description	Author affiliation: Univ. of Electron. Sci. & Technol. of China, Chengdu, China (Jian Lu; Xiangyang Ren; Qishao Zhang)
Abstract	A special TE/sub 011+/spl delta// mode sapphire resonator and an equivalent perfect conductor calibration technique were developed to measure the surface resistance Rs of a single piece of HTS thin film non-destructively at 10 GHz and 77 K. The resonator is formed by a permanent probe and a replaceable test sample. The probe has Q-factor greater than 280000-good sample load repeatability and sensitivity about 20 /spl mu//spl Omega/ for HTS samples under test with dimension equal to or greater than /spl phi/28 mm. The calibration employs a symmetric configuration which presents an equivalent Rs of zero ohm and ensures the accuracy of the measurement. The measured Rs data of YBCO thin films made by laser ablation and magnetic sputtering are less than 250 /spl mu//spl Omega/.<>
Starting Page	959
Ending Page	963
File Size	283900
Page Count	5
File Format	PDF
ISBN	0780320468
DOI	10.1109/ICCS.1994.474261
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-11-14
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Tellurium Calibration Surface resistance High temperature superconductors Probes Sputtering Conductive films Electrical resistance measurement Transistors Nondestructive testing
Content Type	Text
Resource Type	Article

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