NDLI: Goovtant: an efficient mixed level ATPG to test realistic faults in complex CMOS circuits

Content Provider	IEEE Xplore Digital Library
Author	Flottes, M.L. Landrault, C. Paul, S. Pravossoudovitch, S.
Copyright Year	1992
Description	Author affiliation: Lab. d'Inf. de Robotique et de Microelectron, Montpellier II Univ., France (Flottes, M.L.; Landrault, C.; Paul, S.; Pravossoudovitch, S.)
Abstract	An efficient solution for test pattern generation based on a switch-level description of complex CMOS circuits is presented. To obtain gate-level speeds and to test realistic CMOS failures, this mixed-level approach recommends structural and functional grading during the preprocessing phase. Conducting path analysis, relaxation algorithms, and truth-table analysis all contribute to functional grading. Results show that the time required for these additional preprocessing steps is close to negligible compared to total CPU time. During test pattern generation (TPG), fault injection can be performed at switch level with precise knowledge of CMOS technology, while the propagation and backtrace steps are applied to the circuit functional model. Thus, classical TAG algorithms can be used. Two learning techniques that mainly deal with the fault injection step and are compatible with most of the other published techniques are introduced. Their use is optional in this mixed-level approach, but they can significantly speed up TPG.<>
Starting Page	387
Ending Page	390
File Size	321490
Page Count	4
File Format	PDF
ISBN	0780305930
DOI	10.1109/ISCAS.1992.229932
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1992-05-10
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic test pattern generation Circuit faults Circuit testing Test pattern generators Switching circuits Algorithm design and analysis Switches CMOS technology Central Processing Unit Performance evaluation
Content Type	Text
Resource Type	Article

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