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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gunhee Han Pineda de Gyvez, J. Sanchez-Sinencio, E. |
| Copyright Year | 1996 |
| Description | Author affiliation: Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA (Gunhee Han) |
| Abstract | This paper presents a feasibility analysis to predict the optimal size of VLSI CNN implementations. A 3/spl times/3 CNN IC test prototype was designed and fabricated for this purpose. The study considers both the manufacturability and computing performance power of hypothetical large CNN arrays. The manufacturability analysis has been geared towards IC yield prediction using our actual IC layout along with some realistic parameters representing the "cleanliness" of the manufacturing line. Additionally, from experimental results we have found that offset effects are dominant and if they are not properly canceled they can produce incorrect processing results. As a one-on-one mapping between image pixels and CNN cells is practically impossible, the computing performance analysis concentrates on the optimal array size needed to efficiently implement a multiplexing scheme versus the hypothetical fully parallel CNN architecture. Our results indicate that a 50/spl times/50 array is feasible for a time multiplexing scheme. This array will consume around 4 W. The predicted yield of such array is about 70%. The implementation cost is around 30% of a 100/spl times/100 array, or alternatively only 2% of a 200/spl times/200 array, and only 0.04% slower than a hypothetical fully parallel processing architecture. |
| Starting Page | 387 |
| Ending Page | 392 |
| File Size | 415642 |
| Page Count | 6 |
| File Format | |
| ISBN | 078033261X |
| DOI | 10.1109/CNNA.1996.566605 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1996-06-24 |
| Publisher Place | Spain |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Cellular neural networks Integrated circuit layout Very large scale integration Integrated circuit testing Prototypes Computer aided manufacturing Pixel Concurrent computing Performance analysis Computer architecture |
| Content Type | Text |
| Resource Type | Article |
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