NDLI: High speed channel resistive sensor interface with RHBD in 0.5 µm SiGe BiCMOS for UWT from −180°C to 120°C

Content Provider	IEEE Xplore Digital Library
Author	Xueyang Geng Desheng Ma Zhenqi Chen Fa Dai Cressler, J.D. Yaeger, J.A. Mojarradi, M.M. Mantooth, A. Blalock, B.J. Berger, R.W.
Copyright Year	2011
Description	Author affiliation: Jet Propulsion Laboratory, USA (Yaeger, J.A.; Mojarradi, M.M.) \|\| University of Tennessee at Knoxville, USA (Blalock, B.J.) \|\| BAE Systems, USA (Berger, R.W.) \|\| Georgia Institute of Technology, USA (Cressler, J.D.) \|\| Auburn University, USA (Xueyang Geng; Desheng Ma; Zhenqi Chen; Fa Dai) \|\| University of Arkansas, USA (Mantooth, A.)
Abstract	High speed channel (HSC) resistive sensor interface is an analog sampling channel designed for measuring the resistance variations with data rate at 5 kHz. It measures the external resistance variation and digitizes the received signal using a 12-bit analog to digital converter (ADC). The HSC includes a Wheatstone bridge with programmable configurations, a high voltage cap stack sampler, a $6^{th}$ order Butterworth switching capacitor filter, and a continuous time variable gain amplifier (VGA). An 8-bit voltage mode calibration digital to analog converter (DAC) is used to calibrate the common mode voltage level. An 8-bit current mode stimulus DAC is used to provide the current source to the Wheatstone bridge through a high voltage current mirror. With radiation hardening by design (RHBD), the HSC is implemented in a 0.5 µm SiGe BiCMOS technology for applications in aerospace environment under extreme temperature, radiation, pressure and vibration.
Starting Page	79
Ending Page	82
File Size	701770
Page Count	4
File Format	PDF
ISBN	9781612841656
ISSN	10889299
e-ISBN	9781612841663
DOI	10.1109/BCTM.2011.6082753
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-10-09
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Bridge circuits Temperature measurement Capacitors Silicon germanium Active filters Resistors Mirrors RHBD High speed channel (HSC) resistive sensor Butterworth filter DAC Wheatstone bridge cryogenic circuits
Content Type	Text
Resource Type	Article

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