NDLI: Using mobile devices on ATE systems

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Table of contents

Preserving test program set (TPS) performance after legacy automated test equipment (ATE) upgrade

A novel approach to RF/microwave stimulus for legacy ATE

CASS / VDATS interoperability exploration

Test Strategies for minimizing the overall cost of test in moving from “cost based/government furnished equipment” to “firm fixed price” contracts

Component obsolescence management model for long life cycle embedded system

Test means at airbus military: Covering the aircraft test life-cycle with a common and standard approach

Life cycle planning from product development to long term sustainment

Boundary scan as a system-level diagnostic tool

Testability modeling usage in design-for-test and product lifecycle cost reduction

Data awareness from ATE

Low-cost and small footprint solution for testing low-voltage differential signal video displays

Increasing the resolution of a uniform quantizer using a deterministic dithering signal

Enhancing vibration analysis by embedded sensor data validation technologies

Interpreting system switching specifications and how they relate to waveform quality

Applying system engineering processes to legacy test program set modernization

Implementing a cots design approach to reduce development time of complex microwave test adapters

Windows Presentation Foundation (WPF) technology meets the challenges of operator interface design in automatic test systems

Electronic countermeasures (ECM) technique measurements and automation methods

Using RF Recording Techniques to Resolve Wireless Channel Interference Problems

Automated continuity tester for large wire-wrapped avionics chassis

Using a plug-in model to simplify and enhance ATE test software capabilities

Testbricks: Software framework for IEEE Standard 1641 test programs

TPS design and development for CMA program using LM-STAR®

Supporting a wide variety of communication protocols using partial dynamic reconfiguration

Advancing RF test with open FPGAs

Accelerate instrument control and automation

Simplifying test system development with IVI.NET

Preparing for an IPv6 world with LXI instruments

Leveraging IVI for instrument wrapper development

Using mobile devices on ATE systems

Integration of mobile devices and ATE systems

New source measure unit architecture for control loop configurability

What to do when your automated test equipment and Unit Under Test are out of reach?

A commercial approach to military system sustainment

Dealing with the multitudes of legacy TPSs

A standards-based approach to gray-scale health assessment using fuzzy fault trees

Multi-criteria cartography investigation on diagnostics and prognostics techniques suited for system and vehicle health maintenance

Novel diagnostic and prognostic techniques using electromagnetic interference (EMI) measurements to detect degradation in electronic equipment

Prognostics of Power Electronics, methods and validation experiments

Application of ATML test results and intrastage to facilitate intelligent data analysis

Security for mobile ATE applications

An open source software framework for the implementation of an open systems architecture, run-time system

TPS rehost efficiency improvement considerations

Reducing the cost of ATE software development

Legacy test program sets migration using fault modeling and dynamic reasoning

Distributed intelligent health monitoring with the coremicro Reconfigurable Embedded Smart Sensor Node

A low-cost arc fault detector for aerospace applications

A method of combining intermittent arc fault technologies

Architecting high-throughput PXI systems

Test system consolidation

A new class of test instrument: The FPGA based module

The practical realities of high-speed digital test in a production environment

Considerations when migrating from traditional instrumentation to PXI instrumentation

An integrated toolset for ontology-guided diagnostic knowledge discovery

Soft error detection via double execution with hardware assistance

Stress testing software to determine fault tolerance for hardware failure and anomalies

Digital up conversion VS IQ modulation using a wideband arbitrary waveform generator

Portable field measurement of mobile radio systems, effective radiated power, and receiver sensitivity

Incorporating advanced instrumentation capabilities into a PXI digital multimeter instrument

Where's the beer? A paradigm shift in flight-line armament testing

Experimental applications of Automatic Test Markup Language (ATML)

Circuit card test and diagnosis using electromagnetic emission analysis

Arithmetic compaction circuits for mixed-signal systems testing

Automatic Modulation Recognition techniques based on cyclostationary and multifractal features for distinguishing LFM, PWM and PPM waveforms used in radar systems as example of artificial intelligence implementation in test

A non-arduous way to do signal routing

Leveraging the cloud to create a network centric support environment for support equipment

Creating automated test and repair solutions with advanced diagnostics and ATE software

Accelerated aging experiments for capacitor health monitoring and prognostics

2011 IEEE AUTOTESTCON

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IEEE Autotestcon, 2005.

Proceedings AUTOTESTCON 2004.

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.

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Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s

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Using mobile devices on ATE systems

Content Provider	IEEE Xplore Digital Library
Author	Williams, I.
Copyright Year	2012
Description	Author affiliation: EADS North America Test and Services, Irvine, CA, USA (Williams, I.)
Abstract	On large UUTs such as helicopters or jet aircraft, it is often difficult to perform required tests using a static test station located outside the UUT. For example, running a test sequence that requires a technician to follow a set of instructions, such as toggling breakers and switches in an aircraft cockpit, can be challenging and time-consuming. This situation may require the technician to move in and out of the cockpit after each test, or perhaps even require the use of two technicians - one reading off the instructions and the other performing the task. Integrating mobile devices into ATE systems allows the technician to freely move about the UUT, both inside and out, while running the TPS. The mobile device displays the instructions and receives the technician's response while the main ATE console executes the test program and collects the data.
Starting Page	147
Ending Page	152
File Size	319075
Page Count	6
File Format	PDF
ISBN	9781467306980
ISSN	10887725
e-ISBN	9781467307000
DOI	10.1109/AUTEST.2012.6334536
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-09-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Mobile communication Smart phones Hardware Operating systems Security
Content Type	Text
Resource Type	Article

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