NDLI: A wavelet packets and PCA based method for testing of analog circuits

Content Provider	IEEE Xplore Digital Library
Author	Chaojie Zhang Shuhai Liang Guo He Xiaowei Yan
Copyright Year	2009
Description	Author affiliation: Unit 92060 of CPLA, Dalian, Liaoning, China (Xiaowei Yan) \|\| College of Naval Architecture and Power, Naval University of Engineering Wuhan, Hubei, China (Chaojie Zhang; Shuhai Liang; Guo He)
Abstract	A method based on wavelet packets and PCA is developed for testing of analog circuits. It can detect both hard and soft faults in an analog electronic circuit by analyzing its output voltage response. The wavelet packets decomposition tree of the output voltage response is computed and the energy of every decomposed signal is used to form the feature vector. These features are combined by PCA to detect faults of the circuits-under-test (CUT). The principal component model of fault-free circuits is constructed before the actual testing process. Then we can use this principal component model to test the CUT. The features of the CUT are compared with the principal component model to calculate the statistic for fault detection. The proposed method can overcome the difficulty in selecting features and determining thresholds according to the expert's empirical knowledge. It was used to test the Sallen-Key filter and compared with existing methods. The results show the effectiveness of the proposed method.
Starting Page	348
Ending Page	352
File Size	488514
Page Count	5
File Format	PDF
ISBN	9781424449804
ISSN	10887725
DOI	10.1109/AUTEST.2009.5314027
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-09-14
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Wavelet packets Principal component analysis Analog circuits Electrical fault detection Circuit faults Fault detection Voltage Electronic circuits Circuit analysis wavelet packets analog circuits test feature extraction output voltage response principal component analysis (PCA)
Content Type	Text
Resource Type	Article

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