NDLI: Advances in ULTRA-accurate temperature measurement design

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Weathering the storm: The trials and tribulations of a digital test instrument

Automation tools for CASS and RTCASS

Airflow monitor: An effective approach to protecting assets and increasing safety in automated test equipment

Use of JTAG boundary-scan for testing electronic circuit boards and systems

Closed Loop Knowledge System (CLKS)

High-speed ADC dynamic performance validation: The impact of skew-corner lot testing

Laser Doppler vibrometry use in detecting faulty printed circuit boards

Intermittent Fault Detection and Isolation System

Multiresolution sensor fusion approach to PCB fault detection and isolation

Testing for systems readiness - a perspective for the future

Signal analysis of antennas for high altitude airborne cellular base stations

RFID threshold accelerometer

Motion controller design considerations for Hardware-in-the-Loop testing

A general-purpose low-cost compact spatial-temporal data logger and its applications

ATML and ‘dot’ standards status

Justifying DFT with a hierarchical top-down cost-benefit model

The economics of harm prevention through Design for Testability

IC design-for-test and testability features

Test patterns for ICs that are both secure and have very high coverage

IEEE standards for prognostics and health management

Power supply health management — deploying prognostics technology for enhanced weapon system depot support

Automated data acquisition for a Prognostics and Diagnostics Health Monitoring System

Automating part stack-up analysis

Automating HIL test setup and execution

Improving systems engineering execution and knowledge management

Documentation accountability: Approval to archiving

A PXI fast switching LO synthesizer enables 26.5 GHz synthetic instruments

Arbitrary Waveform Generators for synthetic instrumentation

RF Synthetic instrumentation used to support EW test capability

Cost effective, versatile, high performance, spectral analysis in a Synthetic Instrument

Intelligent Diagnostic Reasoning System deployment process and results

Using historic test program data to improve the repair process

Test point selection of analog circuits based on fuzzy theory and ant colony algorithm

Establishing an approach to systematically improve the effectiveness of fleet support

The Test Executive: The strength of testing and diagnosis

Dramatically reduce TPS development costs over all ATE platforms while still achieving accurate test results

A distributed system for aircraft hydraulic system simulation test based on LXI

A practical examination of model reuse in support of health management application integration

Design of optimized reference signal for Joint Time-Frequency Domain Reflectometry-based wiring diagnostics

An efficient Novelty Detector for online fault diagnosis based on Least Squares Support Vector Machines

An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors

Verifying the completeness of test

Simplifying the economics of test and repair in both the factory and depot

Noise concerns and remedies in VXI and PXI systems

Synthetic instrumentation. A practical implementation into SAMe

Mapping multiple legacy instruments and associated measurements into a single synthetic test environment

A flexible family of PXI RF/MW Down Converter modules

Making custom measurements with high-speed digitizers - In the FPGA or host processor

A test methodology for determining space-readiness of Xilinx SRAM-based FPGA designs

A novel methodology to combine and speed-up the verification process of simulation and measurement of integrated circuits

A simple ESR measurement technique for capacitor using switching DC-DC booster

The application of automatic test equipment in designing spare parts

Implementing ATML into the Automatic Test System development and execution workflow

Techniques for architecting high-performance hybrid test systems

A COTS approach to custom RF requirements using LXI class a technology

An XML-based test development and deployment framework for mixed-signal and digital devices

State of IEEE 1641 standard, applications and UK MOD policy

Implementing IEEE 1641 - using a complete system

Implementing IEEE 1641 - resource drivers & COTS languages

A practical usage of the 1641 signal definition using the Test Procedure Language (TPL) and a Carrier Language (CL)

RAI’s role within IEEE 1641 and ATML

A novel device for fault isolation at aircraft

Fault detection and visualization through micron-resolution X-ray imaging

New methodologies for eliminating No Trouble Found, No Fault Found and other non repeatable failures in depot settings

Using distributed computing & advanced synchronization techniques for high performance test

Best practices for large-scale signal conditioning systems

Advances in ULTRA-accurate temperature measurement design

Integrating fiber Bragg grating sensors with sensor networks

PXI Express technology and mainstream applications

Complex automatic test system refurbishment — a case study of more affordable & sustainable testing for nose radomes

Legacy support in a new age - a digital perspective

Enabling net-centric diagnostics in the F/A-18 automated maintenance environment

Analyzing Automated Maintenance architectures to provide flexible smart maintenance capabilities

Case study of Near Field Signature Analysis (NFSA) as a diagnostic tool for high frequency circuits

Sensors for fault detection using chemical off-gassing analysis

Automating control and evaluation of FPGA testing using SJ BIST®

Frequency Synthesizer testing for robust design

Testing Challenges for Next-Generation Radios

Wire-once infrastructure for optimal test lab efficiency

Design approaches for developing a high density, high performance analog test instrument

Diagnostic Ambiguity and Parameter Optimization in Classifier Fusion: Application to Gas Turbine Engine Data

Parallel testing techniques for optimizing test program execution and reducing test time

Multicore programming techniques for high-performance ATE

Design challenges for realization of the advantages of embedded multi-core processors

Best practices for successfully managing long-term PXI deployments

Taking LXI-based systems to the next level with “A-Class” technology

Integrating legacy instruments in an LXI based test and measurement system

Service orientation: Consideration for next generation test software architecture

A test program translator based on the ATML test description schema

Signal intelligence and surveillance with COTS hardware

Applying distributed architecture to the modernization of US Air Force Jet engine test cells

RF/microwave switch considerations

Selecting the right data storage approach for an automatic test system

Integrating wireless measurements with wired systems

Hands free data collection for aircraft maintainers

Optimizing test systems for operational test benefits using parallel test capable instruments

Parallel test tasks scheduling on multi-core platform

Instrument optimization in parallel test system development

Using C/C++ as a common software interface for test systems

DATSA obsolescence management approach

Life after Visual Basic 6.0 — where to go from here

Applying high performance digital instrumentation for video test applications

Test intellectual property trends, test issues and the wealth of owning test in-house

Regression analysis of automated measurment systems

A COM-based instrument interchangeable framework and its realization approach

Unraveling the Cannot Duplicate and Retest OK problems by utilizing physics in testing and diagnoses

Innovative approach to test dramatically cuts IC design cycles

Analysis of electromagnetic emissions to determine UUT health

A novel, cost-effective method for loudspeakers parameters measurement under non-linear conditions

Bringing focus to IVHM solution development

ASTHRA an automated robotic vehicle for the disabled patients using embedded systems

Automotive battery management systems

Sequential test strategies with unreliable tests

Improve design efficiency and test capabilities with HIL Simulation

Protocol Aware ATE with FPGA-based hardware

Solving the U S. Air Force’s ATS proliferation problem — the VDATS solution

VDATS and the DoD ATS framework

Implementation of ATML Test Results on the USAF Versatile Depot Automated Test Station

UUT Explorer: Shop Replaceable Unit (SRU) graphical display application

An ATLAS to C conversion utility for VDATS

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Advances in ULTRA-accurate temperature measurement design

Content Provider	IEEE Xplore Digital Library
Author	Gareau, J.
Copyright Year	2008
Description	Author affiliation: Data Translation, Inc, Marlboro, MA (Gareau, J.)
Abstract	Temperature is the worldpsilas most widely measured property. Most temperature measurement instruments deployed today rely on technology architectures developed when silicon-based devices were far more costly and DOS ran computers. New approaches to analog design have changed this paradigm. This paper describes how the latest techniques in analog technology can be applied to the development of ultra-accurate temperature measurement instruments.
Starting Page	348
Ending Page	353
File Size	846724
Page Count	6
File Format	PDF
ISBN	9781424422258
ISSN	10887725
DOI	10.1109/AUTEST.2008.4662639
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-09-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Instruments Temperature measurement Converters Accuracy Noise Software Multiplexing Ethernet data acquisition multiplexers DC/DC converters parallel instruments galvanic isolation USB LXI
Content Type	Text
Resource Type	Article

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