NDLI: Test point selection of analog circuits based on fuzzy theory and ant colony algorithm

Content Provider	IEEE Xplore Digital Library
Author	Zhang Chao-jie He Guo Liang Shu-hai
Copyright Year	2008
Description	Author affiliation: Coll. of Naval Archit. & Power, Naval Univ. of Eng., Wuhan (Zhang Chao-jie; He Guo; Liang Shu-hai)
Abstract	Optimum selection of test points can reduce the test cost by eliminating redundant measurements and is important to reduce the computation cost. In order to select the optimum test points of analog circuits, a method based on fuzzy theory and ant colony algorithm is proposed. The traditional ant colony algorithm model was updated for test point selection of analog circuits. The basic model is given and the general rule to use this method to select the optimum test points of analog circuits is described in detail. The proposed method was used in the fault diagnosis system of time delay circuit board used in the remote-control system of some marine engine. The results show that this method can educe the optimum test points and has high practical value.
Starting Page	164
Ending Page	168
File Size	446372
Page Count	5
File Format	PDF
ISBN	9781424422258
ISSN	10887725
DOI	10.1109/AUTEST.2008.4662605
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-09-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Analog circuits Delay effects Printed circuits Fault diagnosis Computational modeling Biological system modeling ant colony algorithm (ACA) analog circuits test point selection fault diagnosis fuzzy theory
Content Type	Text
Resource Type	Article

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