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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ptacek, D. |
| Copyright Year | 2006 |
| Description | Author affiliation: Rockwell Collins Inc, Cedar Rapids, IA (Ptacek, D.) |
| Abstract | Rockwell Collins, Inc (RCI) developed a proprietary test executive known as ADATE to support Rockwell Collins Factory and Field testing of the products Rockwell Collins sells to commercial airborne customers. This test executive has been in service for approximately 18 years, during which, the software has witnessed continual evolution as more products are applied to the common test platforms. ADATE is a script interpreter type of test executive. Rockwell Collins defined a simple and easy to read script syntax. The syntax is loosely based on Atlas, Pascal, and Ada. Each TPS is written in this script syntax and never compiled. ADATE interprets each statement, converts the English readable commands into the appropriate low-level commands which are sent down the communication bus to the device(s). ADATE does have an abstraction layer between the test application script code, but the functionality exposed to the script code is tightly coupled to the specific device interface as ADATE performs device control at the message I SCPI level of communication. Rockwell Collins currently has five base ATE types which run ADATE, more than 200 ATE instances deployed, over 450 different TPS test applications, each of which test multiple statuses of the same product. This legacy infrastructure requires support in the typical range of 20-40 years. When device obsolescence occurs, the financial risk is very large as it has the potential to ripple through all TPS test applications due to the likely change of device functionality and performance characteristics. We believe IVI has a partial answer to this financial risk. IVI has great value in defining the common software interface to the device class. The benefits we see are: i) the ADATE source code managing the device doesn't require a change when an obsolete device is replaced and this reduces test executive maintenance costs ii) exposing common script functionality across "like" devices reduces the risk of change to each test application already deployed iii) the ability to leverage device vendor's drivers rather than developing our own This presentation will review Rockwell Collins experiences in implementing the IVI Scope Class drivers and bring to light what we found, both good and bad, as well as some techniques we believe others can use to leverage IVI drivers in situations where they may not be otherwise $considered^{.}$ |
| Starting Page | 795 |
| Ending Page | 798 |
| File Size | 4847017 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424400511 |
| ISSN | 10887725 |
| DOI | 10.1109/AUTEST.2006.283766 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-09-18 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Instruments Software testing Application software Communication system control Production facilities Performance evaluation Software performance Risk management Cost function Software maintenance |
| Content Type | Text |
| Resource Type | Article |
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