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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Pattipati, K.R. Deb, S. Dontamsetty, M. Maitra, A. |
| Copyright Year | 1990 |
| Description | Author affiliation: Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA (Pattipati, K.R.; Deb, S.; Dontamsetty, M.; Maitra, A.) |
| Abstract | A brief overview of the Systems Testability Analysis and Research Tool (START) software package for automatic test sequencing and testability analysis of complex hierarchically described modular systems is presented. It consists of algorithms based on information theory, heuristic search, and graph theory to solve various facets of the test sequencing and testability analysis problems. A system is modeled in the failure space as a hierarchical directed graph with nodes denoting modules and test points and AND nodes denoting redundancy. Interconnections among the nodes denote their immediate functional dependencies. START supports hierarchical testing in accordance with the maintenance strategy; a failure source may be isolated to a component or a module at any level, e.g. LRU (line replaceable unit), SRU (shop replaceable unit), etc. Other practical features include options to integrate diagnosis with repair (after partial diagnosis) and to optimize test time, test cost, or test and repair cost. An interactive menu-mouse graphical interface serves as a high-level front end to these algorithms and enables the user to graphically enter and modify hierarchical functional models of systems.< |
| Starting Page | 395 |
| Ending Page | 402 |
| File Size | 772660 |
| Page Count | 8 |
| File Format | |
| DOI | 10.1109/AUTEST.1990.111540 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1990-09-17 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | System testing Software testing Circuit testing Automatic testing Circuit faults Production facilities Very large scale integration Software packages Algorithm design and analysis Cost function |
| Content Type | Text |
| Resource Type | Article |
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