NDLI: The business of objects

Content Provider	IEEE Xplore Digital Library
Author	Nodine, W.A. Dean, J.S. Weiss, D.H.
Copyright Year	1995
Description	Author affiliation: SA-ALC/LDA, Kelly AFB, TX, USA (Nodine, W.A.; Dean, J.S.)
Abstract	The application of Object Oriented Technology to the generation of automatic test programs holds great promise for the reduction of test program development costs. Standards and practices to enable this cost reduction through Object Technology are evolving through the Institute of Electronic and Electrical Engineers (IEEE) initiative known as ABBET-"A Broad Based Environment for Test" Objects are inherently more reusable due to the elimination of hardware dependencies that are found in most procedural test codes. To initiate this reuse will require a changing of acquisition practices and the building of an object friendly infrastructure (legal guidelines, business practices, test development tools and methods) to foster and promote reuse. This paper is intended to discuss the anticipated needs to accomplish this and, perhaps, establish some priority in meeting those needs.
Starting Page	204
Ending Page	209
File Size	582528
Page Count	6
File Format	PDF
ISBN	0780326210
DOI	10.1109/AUTEST.1995.522674
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-08-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software testing Costs Electronic equipment testing Software standards System testing Automatic testing Electronic mail Code standards Hardware Law
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Air force modular automatic test equipment development program

Designing test environments to maximize TPS transportability

Benefits of a TPS virtual layer

Potential applications of IEEE standards to IFTE

Supporting hardware independence in the next generation of automatic test equipment

The IEEE ABBET lower layers definition and status

Test executive features for improved TPS debug

Reducing costs through the use of Special Purpose Automatic Test Equipment (SPATE)

Building scalable virtual instrumentation systems

The business of objects

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