NDLI: Detecting intermittent test failures with the aid of environmental stress screening

Content Provider	IEEE Xplore Digital Library
Author	Johnson, P. Rabe, D.
Copyright Year	1995
Description	Author affiliation: Sunset Resources Inc., San Antonio, TX, USA (Johnson, P.; Rabe, D.)
Abstract	Confirmation of avionics field failures by a depot maintenance organization is often performed on Automatic Test Equipment (ATE) which is designed to certify a module as "fit to fly". When the ATE does not confirm the failure, the field failure is generally regarded to have been an intermittent event. For any application, these are a major cost driver, and for safety-critical applications, intermittent events are intolerable. As part of the depot maintenance plan to assure a reliable repair operation, an Environmental Stress Screening (ESS) process is employed to detect and eliminate latent defects induced by the repair operation. The time available during this process allows the application of test and monitoring equipment designed specifically to detect and identify intermittent failures.
Starting Page	127
Ending Page	134
File Size	669295
Page Count	8
File Format	PDF
ISBN	0780326210
DOI	10.1109/AUTEST.1995.522664
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-08-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Engines Aerospace electronics Thermal stresses Electronic switching systems Condition monitoring Fuels System testing Manufacturing Fault detection
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

An analyzer for detecting intermittent faults in electronic devices

Managing and Predicting Intermittent Failures Within Long Life Electronics

Built-in system test and fault location

Stress screening of electronic modules: investigation of effects of temperature rate of change

On the Implications of R&M 2000 Environmental Stress Screening

A modified bathtub curve with latent failures

Anomaly detection in electronic products

System reliability

Microprocessing to Reduce MTTR of Analog Systems

Detecting intermittent test failures with the aid of environmental stress screening

Similar Documents

An analyzer for detecting intermittent faults in electronic devices

Managing and Predicting Intermittent Failures Within Long Life Electronics

Built-in system test and fault location

Stress screening of electronic modules: investigation of effects of temperature rate of change

On the Implications of R&M 2000 Environmental Stress Screening

A modified bathtub curve with latent failures

Anomaly detection in electronic products

System reliability

Microprocessing to Reduce MTTR of Analog Systems

Detecting intermittent test failures with the aid of environmental stress screening