NDLI: Automated Data Acquisition System For FET Measurement and it's Application

Content Provider	IEEE Xplore Digital Library
Author	Fan, Siqi Root, David E. Meyer, Jeff
Copyright Year	1991
Description	Author affiliation: Hewlett Packard Co., NMD. Santa Rosa, CA 95403 (Fan, Siqi; Meyer, Jeff) \|\| Hewlett Packard Co., NMD. Santa Rosa, CA 95403; Hewlett Packard Co., MWTD. Santa Rosa, CA 95403 (Root, David E.)
Abstract	The new measurement-based HP FET Model [l] greatly improves large-signal accuracy because the model nonlinearities are explicitly constructed from device data. To achieve this accuracy, a software product based on the HP IC-CAP program was developed to acquire FET data and package it for use in a nonlinear circuit simulator. This paper describes an adaptive, automated data acquisition system (ADAS) for device on-wafer measurements and its application to the HP FET Model generation process. The ADAS solves the problem of automatically determining the entire, device-specific, safe operating region of the FET from only data sheet information. The system adaptively chooses the bias points at which to measure, collects DC and small-signal S-parameter data, and sends it to the HP FET Model-Generator where it is packaged for use with the new HP FET Model. Because the techniques involved are very general, they can be easily applied for characterizing other classes of devices and to provide FET data for more conventional parameter extraction techniques.
Starting Page	107
Ending Page	119
File Size	474028
Page Count	13
File Format	PDF
ISBN	0780356861
DOI	10.1109/ARFTG.1991.324044
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1991-12-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Data acquisition FETs Application software Packaging Voltage Velocity measurement Time measurement Software packages Nonlinear circuits Circuit simulation
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A new empirical model for GaAs FET in nonlinear circuit simulation

Technology Independent Large Signal Non Quasi-Static FET Models by Direct Construction from Automatically Characterized Device Data

Corona charger current-voltage curve and uniformity analysis package

Design Methodologies for Nonlinear Circuit Simulation and Optimization

Virtual Measurement System for Muzzle Velocity and Firing Frequency

Cadence-based simulation of floating-gate circuits using the EKV model

Nonlinear charge modeling for FET large-signal simulation and its importance for IP3 and ACPR in communication circuits

FET modeling for analog and digital applications

A new methodology for simultaneous switching noise simulation

Automated Data Acquisition System For FET Measurement and it's Application

Similar Documents

A new empirical model for GaAs FET in nonlinear circuit simulation

Technology Independent Large Signal Non Quasi-Static FET Models by Direct Construction from Automatically Characterized Device Data

Corona charger current-voltage curve and uniformity analysis package

Design Methodologies for Nonlinear Circuit Simulation and Optimization

Virtual Measurement System for Muzzle Velocity and Firing Frequency

Cadence-based simulation of floating-gate circuits using the EKV model

Nonlinear charge modeling for FET large-signal simulation and its importance for IP3 and ACPR in communication circuits

FET modeling for analog and digital applications

A new methodology for simultaneous switching noise simulation

Automated Data Acquisition System For FET Measurement and it's Application