NDLI: An Automated Methodology for the Measurement and Non-Linear Model Parameter Extraction of GaAs MESFETs

Content Provider	IEEE Xplore Digital Library
Author	Lerner, Larry McGuire, Chuck
Copyright Year	1988
Description	Author affiliation: EEsof Inc., Westlake Village CA. 91362 (Lerner, Larry; McGuire, Chuck)
Abstract	This paper presents an automated methodology for the measurement and non-linear modeling of GaAs MESFETS. The FET model extraction is based on the optimization of bias-dependent representations of DC-IV and linear equivalent circuit element values to small signal measurements of DC-IV and s-parameter data acquired over a wide range of operating bias, Vgs and Vds. The data acquisition is fully automated through the use of ANACAT(TM) and is collected and managed in an open ASCII format. The single set of measurement data serves as the input to the extraction of several popular bias-dependent FET models using Xtract(TM), a fully interactive FET model extraction tool developed by EEsof. The Xtract model file output may be used directly by Touchstone(TM), Libra(TM), or Microwave Spice(TM) to simulate the large-signal performance of the device in addition to serving as a master linear model for replicating linear small signal s-parameters at any operating point within the device's useful range. As an example, the paper presents the model extraction for a half-micron TriQuint GaAs MESFET. The example discusses the fully automated FET measurement and the subsequent extraction of three bias-dependent models. Both linear and non-linear model simulations are compared with actual measurements of the same device.
Starting Page	109
Ending Page	117
File Size	537825
Page Count	9
File Format	PDF
ISBN	0780356861
DOI	10.1109/ARFTG.1988.323922
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1988-12-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Parameter extraction Gallium arsenide MESFETs Data mining Scattering parameters Automatic testing Equivalent circuits Data acquisition Microwave FETs Microwave devices
Content Type	Text
Resource Type	Article

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