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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Clement, A.E. Gilbreath, G.C. McKnight Jr., R. Reintjes, J. Chock, J.M.K. |
| Copyright Year | 1992 |
| Description | Author affiliation: US Naval Res. Lab., Washington, DC, USA (Clement, A.E.; Gilbreath, G.C.; McKnight, R., Jr.; Reintjes, J.; Chock, J.M.K.) |
| Abstract | Dark conductivity measurements for BaTiO/sub 3/ and Ce:SBN:60 using photorefractive two-wave mixing at intensities of less than 10 mW/cm/sup 2/ are reported. It is shown that the most accurate measurements of dark conductivity are made when the y-intercept is computed using a weighted least squares fit including measurements taken near the noise floor for two-wave mixing interactions in a specific crystal. Such a bound is important to determine experimentally when seeking to understand noise mechanisms in a given photorefractive medium. The authors report sigma /sub d/=9.2*10/sup -13/ ( Omega -cm)/sup -1/ for Ce:SBN:60 and sigma /sub d/=5.4*10/sup -12/ ( Omega -cm)/sup -1/ for BaTiO/sub 3/ when intensities less than 10 mW/cm/sup 2/ are included in the calculation. The results obtained also indicate that diffusion length varies with intensity regime. Therefore, experimental configurations may be affected as well.< |
| Starting Page | 625 |
| Ending Page | 628 |
| File Size | 331206 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780304659 |
| DOI | 10.1109/ISAF.1992.300743 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1992-08-30 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Conductivity measurement Photorefractive effect Gratings Noise reduction Photorefractive materials Laser excitation Ultraviolet sources Optical mixing Optical pumping Optical noise |
| Content Type | Text |
| Resource Type | Article |
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